Loading...
Recherche
Derniers dépôts
Dépôts en texte intégral
94
Mots clés
Silica
18O
Pulsed laser deposition
Nuclear resonance profiling NRP
7550Pp
17O
Al2O3
27Alda
Rutherford backscattering spectrometry RBS
Acoustic propreties of solid
Thin film
Annealing
27Aldp
XPS
Oxygen deficiency
Passivation
Nickel
8140Ef
2H
Nanoparticles
Magnetic anisotropy
27Ald p&α
AFM
Thin films
ALD
Stable isotopic tracing
Oxidation
Auger electron spectroscopy AES
GaMnAs
Charge exchange
Hysteresis
3C-SiC
Alloy
Ion implantation
Transparent conductive oxide TCO
Adsorption
Density functional theory
Evaluation
Epitaxial growth
AC susceptibility
Isotopic Tracing
XRD
Raman spectroscopy
Magnetic semiconductors
Kossel diffraction
Indium oxide
Zinc oxide
Periodic multilayer
Metal-insulator transition
Gold
7550Ee
Adsorption Isotherms
Diffusion
Growth
Multilayer
Energy loss
17Op
Silicon
Silicon Carbide
Nitridation
Gallium oxide
Sputtering
Photoluminescence
Atomic Layer Deposition ALD
13C
Topological insulators
Interface defects
Acoustic
Low energy electron diffraction LEED
6855Jk
15N
17Opp
Ion beam analysis
Magnetization curves
Silicon carbide
HfO2
Ferromagnetic resonance
Ageing
ADSORPTION DESORPTION HYSTERESIS
Pb centers
Nanostructures
Defects
Channeling
Adsorbed layers
EPR
Nuclear reaction analysis
Epitaxy
7630Lh
RBS
PIXE
Aluminium
Capillary condensation
SiC
Aluminum
NRP
Alloys
18O resonance
Topological defects
Measurement
X-ray diffraction