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Conference Papers Year : 2014

AUTSEG: Automatic Test Set Generator for Embedded Reactive Systems


One of the biggest challenges in hardware and software design is to ensure that a system is error-free. Small errors in reactive embedded systems can have disastrous and costly consequences for a project. Preventing such errors by identifying the most probable cases of erratic system behavior is quite challenging. In this paper, we introduce an automatic test set generator called AUTSEG. Its input is a generic model of the target system, generated using the synchronous approach. Our tool finds the optimal preconditions for restricting the state space of the model. It only works locally on significant subspaces. Our approach exhibits a simpler and efficient quasi-flattening algorithm than existing techniques and a useful compiled form to check security properties and reduce the combinatorial explosion problem of state space. To illustrate our approach, AUTSEG was applied to the case of a transportation contactless card.
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Dates and versions

hal-01069101 , version 1 (29-11-2016)





Mariem Abdelmoula, Daniel Gaffé, Michel Auguin. AUTSEG: Automatic Test Set Generator for Embedded Reactive Systems. 26th IFIP International Conference on Testing Software and Systems (ICTSS), Sep 2014, Madrid, Spain. pp.97-112, ⟨10.1007/978-3-662-44857-1_7⟩. ⟨hal-01069101⟩
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