Compiler Optimizations Do Impact the Reliability of Control-Flow Radiation Hardened Embedded Software
Abstract
This paper characterizes how compiler optimizations impact software control-flow reliability when the optimized application is compiled with a technique to enable the software itself to detect and correct radiation induced soft-errors occurring in branches. Supported by a comprehensive fault injection campaign using an established benchmark suite in the embedded systems domain, we show that the careful selection of the available compiler optimizations is necessary to avoid a significant decrease of software reliability while sustaining the performance boost those optimizations provide.
Origin | Files produced by the author(s) |
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