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Conference Papers Year : 2010

Test Based on Built-In Current Sensors for Mixed-Signal Circuits

Abstract

This paper presents a test methodology for mixed-signal circuits. The test approach uses a built-in sensor to analyze the dynamic current supply of the circuit under test. This current sensor emphasizes the highest harmonics of the dynamic current of the circuit under test when the current to voltage conversion is done. The goodness of the test method is analyzed first by means of a fault simulation and afterwards through the experimental data obtained from several benchmark circuits.
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hal-01060778 , version 1 (23-11-2017)

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Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho. Test Based on Built-In Current Sensors for Mixed-Signal Circuits. First IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems (DoCEIS), Feb 2010, Costa de Caparica, Portugal. pp.521-528, ⟨10.1007/978-3-642-11628-5_58⟩. ⟨hal-01060778⟩
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