Test Based on Built-In Current Sensors for Mixed-Signal Circuits
Abstract
This paper presents a test methodology for
mixed-signal circuits. The test approach uses a built-in sensor to
analyze the dynamic current supply of the circuit under test. This
current sensor emphasizes the highest harmonics of the dynamic current
of the circuit under test when the current to voltage conversion is
done. The goodness of the test method is analyzed first by means of a
fault simulation and afterwards through the experimental data obtained
from several benchmark circuits.
| Origin | Files produced by the author(s) |
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